Auguściuk E, Bogdanowicz B. Thickness control of thin dielectric layers by the generalized m-line spectroscopy method. Photonics Lett. Pol. [Internet]. 2010 Jun. 29 [cited 2024 Nov. 23];2(2):pp. 70-72. Available from: http://photonics.pl/PLP/index.php/letters/article/view/2-24