Surface quality control of thin SiN layer by optical measurements




Fiber optic interferometers have a wide range of applications including biological and chemical measurements. Nevertheless, in case of a reflective interferometer setup, standard silver mirrors cannot be used in every measurement, due to their chemical activity. In this work, we investigate the surface quality of a thin optical layer of silicon nitride (SiN) which can serve as an alternative material for silver mirrors. We present measurements carried out with a Fabry-Perot fiber optic interferometer working in a reflective mode. Measurement results allow us to determine the surface quality of the investigated layer.

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How to Cite

Gierowski, J., & Pawłowska, S. (2021). Surface quality control of thin SiN layer by optical measurements. Photonics Letters of Poland, 13(3), 61–63.