Structure of sol-gel derived Nb2O5 films for active coating devices

Barbara Kościelska, Marcin Łapiński, Wojciech Sadowski, Marzena Dęby

Abstract


This work presents the results of structure investigations of sol-gel derived Nb2O5 thin films. Traditional therma annealing of as-prepared films leading to Nb2O5 crystalline structure formation [1] was substituted by microwave irradiation. The proposed method allows for covering substrates with a different size and shape. The structure of the films was studied using X–ray diffraction (XRD), atomic force microscopy (AFM) and VIS optical absorption measurements. The films exhibit a quantum size effect. The diameter of nanocrystals depends on microwave radiation power and irradiation time.  

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Photonics Letters of Poland - A Publication of the Photonics Society of Poland
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ISSN: 2080-2242