Optical Metrology with many faces
AbstractA brief editorial overview of the current issue is presented. This special issue of Photonics Letters of Poland devoted to optical metrology contains 15 invited and regularly submitted letters showing a wide range of optical measurement and characterization methods, data processing procedures and their applications.
How to Cite
M. Kujawińska, “Optical Metrology with many faces”, Photonics Lett. Pol., vol. 4, no. 2, p. pp. 44, Jun. 2012.