THz based non-destructive testing system for Security and Inspection Applications

Authors

  • Artur Sobczyk
  • Maciej Sypek
  • Izabela Ducin
  • Piotr Wiśniewski
  • Adam Kowalczyk

DOI:

https://doi.org/10.4302/plp.v16i4.1308

Abstract

Terahertz (THz) technology has garnered significant attention in non-invasive inspection and security applications due to its ability to penetrate common materials like paper, plastics, and fabrics while remaining non-ionizing. This study presents a package THz scanner utilizing a commercially available 292 GHz wave IMPATT source and a custom-designed 3D-printed multifunctional diffractive optical component for beam shaping. The novelty lies in application of the THz source with limited coherence and broadband detectors line. Thus, coherent noise can be suppressed. We discuss the system's design, construction, and performance, demonstrating its feasibility as a cost-effective and adaptable solution for package inspection.

Full Text: PDF

References

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Published

2024-12-31

How to Cite

[1]
A. Sobczyk, M. Sypek, I. Ducin, P. Wiśniewski, and A. Kowalczyk, “THz based non-destructive testing system for Security and Inspection Applications”, Photonics Lett. Pol., vol. 16, no. 4, pp. 87–89, Dec. 2024.

Issue

Vol. 16 No. 4 (2024)

Section

Articles

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