Multilayered structures examination using polarization sensitive optical coherence tomography

Marcin Strąkowski, Jerzy Pluciński, Bogdan B. Kosmowski

Abstract


Optical Coherence Tomography (OCT) is an optical method for non-contact and non-destructive examination of inner structure of multi-layered structures. Polarization sensitive OCT (PS-OCT) is also capable of measuring local optical anisotropy changes. The measurement results, obtained using our custom-built PS-OCT setup, for multilayered birefringent structures demonstrate the applicability of the PS-OCT to characterization of multilayered material stacks containing birefringent polymer layers used e.g. in display technology. In this Letter we present some aspects of our research and experiments and discuss usefulness of polarization sensitive analysis in OCT for examination of technical materials.

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Photonics Letters of Poland - A Publication of the Photonics Society of Poland
Published in cooperation with SPIE

ISSN: 2080-2242